Title : 
Estimating the moisture content of grain from impedance and phase angle measurements
         
        
            Author : 
Kandala, Chari V. ; Sundaram, Jaya
         
        
            Author_Institution : 
Nat. Peanut Res. Lab., Dawson, GA
         
        
        
        
        
        
            Abstract : 
A simple, low cost instrument that measures impedance and phase angle was used along with a parallel-plate capacitance system to estimate the moisture content (MC) of yellow corn. A sample of corn weighing about 100 g was placed between the parallel-plate electrodes and the impedance and phase angle of the system were measured. A semi-empirical equation was developed with the measured values, and their MC values determined earlier by standard air-oven method , using multiple linear regression (MLR) methods. MC values of corn samples in the moisture range of 6% to 20%, not used in the calibration, were predicted by the equation and compared with their standard air-oven values. For over 93% of the samples tested the predicted MC values were within 1% of the air-oven values. This method being nondestructive and rapid will have considerable application in the drying and storage processes of corn and similar grain products.
         
        
            Keywords : 
angular measurement; crops; electric impedance measurement; moisture measurement; regression analysis; air-oven method; impedance-phase angle measurements; moisture content estimation; multiple linear regression; parallel-plate capacitance system; parallel-plate electrodes; semiempirical equation; similar grain products; yellow corn; Capacitance measurement; Costs; Electrodes; Equations; Goniometers; Impedance measurement; Instruments; Moisture measurement; Phase estimation; Phase measurement; Impedance analyzer; capacitance; corn; moisture content; parallel-plate electrodes; phase angle;
         
        
        
        
            Conference_Titel : 
Sensors Applications Symposium, 2009. SAS 2009. IEEE
         
        
            Conference_Location : 
New Orleans, LA
         
        
            Print_ISBN : 
978-1-4244-2786-4
         
        
            Electronic_ISBN : 
978-1-4244-2787-1
         
        
        
            DOI : 
10.1109/SAS.2009.4801779