DocumentCode
2998385
Title
Post-fabrication laser trimming of micromechanical filters
Author
Abdelmoneum, Mohamed A. ; Demirci, Mustafa M. ; Li, Sheng-Shian ; Nguyen, Clark T C
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
2004
fDate
13-15 Dec. 2004
Firstpage
39
Lastpage
42
Abstract
Semi-automatic post-fabrication laser trimming of a second order vibrating micromechanical clamped-clamped beam (CCB) filter has been demonstrated via a pole-correcting algorithm that identifies the individual resonators associated with each peak in a distorted filter response, then uses this information to compute correction factors needed to trim each resonator towards the desired filter passband. Both increases or decreases in resonator frequency are possible via the laser trimming due a geometrically-derived location-dependence, where the direction of the frequency change depends strongly on the location at which the laser removes material. By compensating for dimensional errors due to finite absolute and matching tolerances in planar processes, this trim procedure might eventually be instrumental in making available the banks of very small percent bandwidth micromechanical filters presently targeted for RF-channel selection in future multi-band wireless handsets.
Keywords
band-pass filters; electromechanical filters; error correction; laser beam machining; micromachining; micromechanical devices; resonators; RF-channel selection; clamped-clamped beam filter; correction factors; dimensional error compensation; distorted filter response; filter passband; geometrically-derived location-dependence; multi-band wireless handsets; pole-correcting algorithm; post-fabrication laser trimming; resonator frequency; second order vibrating micromechanical filter; semi-automatic laser trimming; Information filtering; Information filters; Laser beams; Laser noise; Laser transitions; Micromechanical devices; Optical materials; Passband; Resonant frequency; Resonator filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN
0-7803-8684-1
Type
conf
DOI
10.1109/IEDM.2004.1419058
Filename
1419058
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