• DocumentCode
    2998389
  • Title

    A New Integrated Gate Driver with Shift Register Circuits Employing 4 Clocks for 14.1-inch TFT-LCD

  • Author

    He, Changde ; Liao, Congwei ; Liang, Yinan ; Zhang, Shengdong

  • Author_Institution
    Nat. Key Lab. for Meas. Technol., North Univ. of China, Taiyuan, China
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    This paper presents a kind of new integrated hydrogenated amorphous silicon thin film transistor (a-Si:H TFT) gate driver. A major feature of the integrated gate driver is that the gate driver is composed of the proposed novel shift registers employing 4 clocks. The shift of the threshold voltage of the amorphous silicon thin film transistors in the shift register can be decreased significantly, which makes the circuits work stably for a long term. The simulation results show that the driver circuits are able to have the rise and fall time to be less than 3.5 μs in the output waveforms, and the noise voltage to be less than 1 V.
  • Keywords
    amorphous semiconductors; circuit noise; driver circuits; elemental semiconductors; hydrogen; liquid crystal displays; shift registers; silicon; thin film transistors; TFT-LCD; a-Si:H TFT; driver circuits; hydrogenated amorphous silicon thin film transistor; integrated gate driver; noise voltage; output waveforms; shift register circuits; size 14.1 inch; Clocks; Driver circuits; Logic gates; Noise; Shift registers; Stress; Thin film transistors; Intergrated gate driver; TFT-LCD; shift register;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Control Engineering (ICECE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-6880-5
  • Type

    conf

  • DOI
    10.1109/iCECE.2010.1435
  • Filename
    5630789