Title :
A New Integrated Gate Driver with Shift Register Circuits Employing 4 Clocks for 14.1-inch TFT-LCD
Author :
He, Changde ; Liao, Congwei ; Liang, Yinan ; Zhang, Shengdong
Author_Institution :
Nat. Key Lab. for Meas. Technol., North Univ. of China, Taiyuan, China
Abstract :
This paper presents a kind of new integrated hydrogenated amorphous silicon thin film transistor (a-Si:H TFT) gate driver. A major feature of the integrated gate driver is that the gate driver is composed of the proposed novel shift registers employing 4 clocks. The shift of the threshold voltage of the amorphous silicon thin film transistors in the shift register can be decreased significantly, which makes the circuits work stably for a long term. The simulation results show that the driver circuits are able to have the rise and fall time to be less than 3.5 μs in the output waveforms, and the noise voltage to be less than 1 V.
Keywords :
amorphous semiconductors; circuit noise; driver circuits; elemental semiconductors; hydrogen; liquid crystal displays; shift registers; silicon; thin film transistors; TFT-LCD; a-Si:H TFT; driver circuits; hydrogenated amorphous silicon thin film transistor; integrated gate driver; noise voltage; output waveforms; shift register circuits; size 14.1 inch; Clocks; Driver circuits; Logic gates; Noise; Shift registers; Stress; Thin film transistors; Intergrated gate driver; TFT-LCD; shift register;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.1435
