DocumentCode :
2998905
Title :
An Extension of Matthews´ Bound to Multiplex Random Walks
Author :
Hosaka, Yusuke ; Yamauchi, Yukiko ; Kijima, Shuji ; Ono, Hirotaka ; Yamashita, Masafumi
Author_Institution :
Dept. of Inf., Kyushu Univ., Fukuoka, Japan
fYear :
2012
fDate :
21-25 May 2012
Firstpage :
872
Lastpage :
877
Abstract :
Random walk is a powerful tool for searching a network, especially for a very large network such as the Internet. The cover time is an important measure of a random walk on a finite graph, and has been studied well. For the purpose of searching a network, it is quite natural to think that multiple crawlers might cover a network faster than a single crawler. Alon et al. (2011) showed that a multiple random walk by k crawlers covers a network k times faster than a single random walk in certain graphs such as complete graphs, random graphs, etc., while the speeding up ratio is limited only to log k times in other graphs such as cycles and paths. This paper investigates a multiplex random walk by k tokens, in which k tokens randomly walks on a graph independently according to an individual transition probability. For the cover time of a multiplex random walk, we present new inequalities similar to celebrated Matthews´ inequalities for a single random walk, that provide upper and lower bounds of the cover time by its hitting times. We also show that the bounds are tight in certain graphs, namely complete graphs, bipartite complete graphs, and random graphs.
Keywords :
Internet; graph theory; search engines; Internet; certain graphs; complete graphs; finite graph; matthews bound extension; multiple crawlers; multiplex random walks; network searching; random graphs; single crawler; transition probability; Crawlers; Economics; Educational institutions; Linear matrix inequalities; Markov processes; Multiplexing; Standards; cover time; hitting time; random walk;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-0974-5
Type :
conf
DOI :
10.1109/IPDPSW.2012.107
Filename :
6270730
Link To Document :
بازگشت