DocumentCode :
2999069
Title :
A Systematic Error Model of High-Resolution Pipelined Analog-to-Digital Converters
Author :
Chen, Tingqian ; Yao, Bingkun ; Xu, Jun ; Ren, Junyan
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai
Volume :
2
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
158
Lastpage :
161
Abstract :
This work presents a systematic error model of high- resolution pipelined analog-to-digital converters (ADCs) implemented in MATLAB. Many errors limit linearity or noise performance of high-resolution ADCs, such as sampling distortion, slew-rate (SR) limiting, closed-loop gain variation of amplifiers, capacitor mismatch, clock jitter and thermal noise. All errors mentioned above are analyzed and modeled in a set of explicit mathematic expressions. Simulation results based on this model are compared with measured results of a 10-bit prototype ADC.
Keywords :
analogue-digital conversion; clocks; jitter; measurement errors; thermal noise; MATLAB; capacitor mismatch; clock jitter; closed-loop gain variation; explicit mathematic expressions; high-resolution ADC; high-resolution pipelined analog-to-digital converters; sampling distortion; slew-rate limiting; systematic error model; thermal noise; word length 10 bit; Analog-digital conversion; Capacitors; Clocks; Jitter; Linearity; MATLAB; Mathematical model; Performance gain; Sampling methods; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382233
Filename :
4267311
Link To Document :
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