DocumentCode :
2999144
Title :
Impact of surface roughness on silicon and germanium ultra-thin-body MOSFETs
Author :
Low, Tony ; Li, M.-F. ; Fan, W.J. ; Ng, S.T. ; Yeo, Yee-Chia ; Zhu, C. ; Chin, Albert ; Chan, L. ; Kwong, D.L.
Author_Institution :
Dept. of ECE, National Univ. of Singapore, Singapore
fYear :
2004
fDate :
13-15 Dec. 2004
Firstpage :
151
Lastpage :
154
Abstract :
Ultra-thin body (UTB) SOI MOSFET is promising for sub-50 nm CMOS technologies (ITRS, 2003). However, recent experimental finding by Uchida (2002) suggests the need for serious reconsiderations of its long-term scaling capability into the sub-10 nm body thickness (TBODY) regime. Two new phenomena attributed to surface roughness (SR) are identified by Uchida (2002); they are enhanced threshold voltage (VTH) shifts and drastic degradation of mobility with a TBODY dependence according to Uchida (2002) and Sakaki (1934). In this work, we detail a study of these two phenomena in UTB MOSFETs with sub 10 nm TBODY Si and Ge channels. Firstly, the phenomena of enhanced VTH shifts is modeled by accounting for the fluctuation of quantized energy levels due to SR up to second order approximation. Good corroboration with experimental results by Uchida (2002) is obtained. Our model is then applied to examine the impact of enhanced VTn shifts on metal gate workfunction requirements. Secondly, we modeled the SR-limited electron and hole mobility and discuss their impact on the choice of surface orientations. Mobility anisotropy are also examined for the various surface orientations.
Keywords :
MOSFET; elemental semiconductors; germanium; semiconductor device models; silicon; silicon-on-insulator; surface roughness; 10 nm; 50 nm; Ge; SOI MOSFET; SR-limited electron; Si; enhanced threshold voltage shifts; hole mobility; mobility anisotropy; surface orientations; surface roughness; ultra-thin-body MOSFET; CMOS technology; Degradation; Fluctuations; Germanium; MOSFETs; Rough surfaces; Silicon; Strontium; Surface roughness; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-8684-1
Type :
conf
DOI :
10.1109/IEDM.2004.1419092
Filename :
1419092
Link To Document :
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