Title :
Parameters of variodes auto-measurement
Author :
YU, Zhensheng ; Lu, Yhg ; Yu, Yang
Author_Institution :
Sch. of Electron. Inf. Eng., Tianjin Univ., China
Abstract :
This paper introduces a method to measure the C-V characteristics and I-V characteristics of variodes, which featured by adding additional circuits to the original capacity measuring device. This method, which is based on the serial communication between microcontroller and PC, uses PC as system controller to achieve auto-measurement. Compared to the auto-measuring system specified by IEEE 488, this measuring system has a simpler structure and lower cost
Keywords :
characteristics measurement; computerised instrumentation; microcomputer applications; semiconductor device measurement; C-V characteristics; I-V characteristics; IEEE 488; auto-measurement; cost; serial communication; system controller; variodes; Capacitance-voltage characteristics; Circuits; Control systems; Operational amplifiers; Power measurement; Power supplies; Radio frequency; Radiofrequency amplifiers; Temperature; Voltage;
Conference_Titel :
Circuits and Systems, 2000. IEEE APCCAS 2000. The 2000 IEEE Asia-Pacific Conference on
Conference_Location :
Tianjin
Print_ISBN :
0-7803-6253-5
DOI :
10.1109/APCCAS.2000.913619
