DocumentCode :
2999240
Title :
Gray level processing and the recognition of embedded patterns
Author :
Woolfson, M. ; Vandelinde, V.
Author_Institution :
Westinghouse Electric Corporation
fYear :
1972
fDate :
13-15 Dec. 1972
Firstpage :
54
Lastpage :
58
Abstract :
Pattern classes composed of multiple gray level imagery can be recognized through processing of feature sets extracted from measures of the gray level or intensity structures of the patterns. The absence of geometric dependence in the feature extraction method leads to the formation of feature sets which are invariant under the pattern perturbations of translation, rotation, and dilation. This paper considers the application of the gray level processing method to a two-class recognition problem where the object gray level patterns are embedded in a gray level structured background of unknown character. In attacking this problem, a preprocessing algorithm is established which dissects the pattern image into a number of subsets of connected regions as a function of gray level. A "one at a time" sequential minimization procedure is then employed to determine an optimal gray level subset based on a minimum distance criterion.
Keywords :
Feature extraction; Image recognition; Pattern classification; Pattern recognition; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1972 and 11th Symposium on Adaptive Processes. Proceedings of the 1972 IEEE Conference on
Conference_Location :
New Orleans, Louisiana, USA
Type :
conf
DOI :
10.1109/CDC.1972.268940
Filename :
4044862
Link To Document :
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