DocumentCode :
2999298
Title :
New reliability assessment method for solder joints in BGA package by considering the interaction between design factors
Author :
Kondo, Satoshi ; Yu, Qiang ; Shibutani, Tadahiro ; Shiratori, Masaki
Author_Institution :
Yokohama Nat. Univ., Yokohama
fYear :
2007
fDate :
17-19 Sept. 2007
Firstpage :
26
Lastpage :
31
Abstract :
As the integration and the miniaturization of electronics devices, design space become narrower and interactions between design factors affect their reliability. This paper presents a methodology of quantifying the interaction of each design factor in electronics devices. Thermal fatigue reliability of BGA assembly was assessed with the consideration of the interaction between design factors. Sensitivity analysis shows the influence of each design factor to inelastic strain range of a solder joint characterizing the thermal fatigue life if no interaction occurs. However, there is the interaction in BGA assembly since inelastic strain range depends on not only a mismatch in CTE but also a warpage of components. Clustering can help engineers to clarify the relation between design factors. The variation in the influence was taken to quantify the interaction of each design factor. Based on the interaction, simple evaluating approach of inelastic strain range for the BGA assembly was also developed. BGA package was simplified into a homogeneous component and equivalent CTE was calculated from the warpage of BGA and PCB. The estimated equation was derived by using the response surface method as a function of design factors. Based upon these analytical results, design engineers can rate each factor´s effect on reliability and assess the reliability of their basic design plan at the concept design stage.
Keywords :
ball grid arrays; printed circuits; reliability; soldering; BGA package; PCB; electronics devices; homogeneous component; inelastic strain; solder joints; thermal fatigue life; thermal fatigue reliability; Assembly; Capacitive sensors; Design engineering; Electronic packaging thermal management; Equations; Fatigue; Response surface methodology; Sensitivity analysis; Soldering; Thermal factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Investigation of ICs and Systems, 2007. THERMINIC 2007. 13th International Workshop on
Conference_Location :
Budapest
Print_ISBN :
978-2-35500-002-7
Type :
conf
DOI :
10.1109/THERMINIC.2007.4451741
Filename :
4451741
Link To Document :
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