DocumentCode :
2999352
Title :
Temperature Variation Insensitive Energy Efficient CMOS Circuits in a 65nm CMOS Technology
Author :
Kumar, Ranjith ; Kursun, Volkan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI
Volume :
2
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
226
Lastpage :
230
Abstract :
A design methodology based on optimizing the supply voltage for simultaneously achieving energy efficiency and temperature variation insensitive circuit performance is presented in this paper. Circuits exhibit temperature variation insensitive delay characteristics when operated at a supply voltage 67% to 68% lower than the nominal supply voltage. At scaled supply voltages, integrated circuits consume low power at the cost of reduced speed. The proposed design methodology of optimizing the supply voltage for temperature variation insensitive circuit performance is, therefore, particularly attractive for low power applications with relaxed speed requirements. The supply voltages that yield minimum energy and minimum energy-delay product are identified at two different temperatures for circuits in a 65 nm CMOS technology. The energy and speed at the supply voltages providing temperature variation insensitive propagation delay, minimum energy, and minimum energy-delay product are compared. Results indicate that energy efficient integrated circuits with deeply scaled supply voltages can also be made insensitive to temperature fluctuations by considering the temperature dependence of speed in the supply voltage optimization process.
Keywords :
CMOS integrated circuits; integrated circuit design; low-power electronics; thermal analysis; CMOS technology; delay characteristics; energy efficiency; energy efficient CMOS circuits; energy-delay product; integrated circuits; low power applications; size 65 nm; supply voltage optimization process; temperature fluctuations; temperature variation; CMOS technology; Circuit optimization; Costs; Delay; Design methodology; Design optimization; Energy efficiency; Integrated circuit yield; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382251
Filename :
4267329
Link To Document :
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