DocumentCode :
2999426
Title :
Methods and Metrics to improve the Yield of IT using the IT-CMF - an Intel Case Study
Author :
Curley, Martin ; Kenneally, Jim
fYear :
2007
fDate :
19-21 March 2007
Firstpage :
27
Lastpage :
38
Abstract :
This paper provides an overview of the IT capability maturity framework (IT-CMFTM) with a specific focus on the value metrics. The IT-CMFTM is an integrating CIO level framework based on the synthesis of academic research and industry best practice which can help CIOs increase the value that IT delivers and improve the productivity of the IT function. The paper introduces nascent macro measures of IT value performance illustrated with examples and data from an Intel IT case study.
Keywords :
Capability Maturity Model; information technology; investment; IT productivity; IT value performance; IT yield improvement; capability maturity framework; chief information officer level framework; information technology; nascent macro measures; value metrics; Availability; Banking; Best practices; Computer crashes; Control systems; Costs; Investments; Pressure measurement; Productivity; Technological innovation; IT yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Exploring Quantifiable IT Yields, 2007. EQUITY '07. IEEE International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4244-2537-2
Type :
conf
DOI :
10.1109/EQUITY.2007.12
Filename :
5206408
Link To Document :
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