• DocumentCode
    2999444
  • Title

    Room-temperature demonstration of integrated silicon single-electron transistor circuits for current switching and analog pattern matching

  • Author

    Saitoh, Masumi ; Harata, Hidehiro ; Hiramoto, Toshiro

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • fYear
    2004
  • fDate
    13-15 Dec. 2004
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    This paper reports the first room-temperature (RT) operation of integrated single-electron transistor (SET) circuits. We fabricate silicon single-hole transistors (SHTs) with high controllability and obtain large Coulomb blockade (CB) oscillation with the peak-to-valley current ratio (PVCR) of over 103 at RT. A current switch using two SHTs integrated under a single gate is demonstrated at RT. We propose a novel application of SHTs, an ultra-compact analog pattern matching circuit. Its basic operation is demonstrated at RT using three SHTs fabricated on one chip, whose CB peak positions and currents are properly controlled by hole injection into nanocrystals embedded in the gate oxide of SHTs.
  • Keywords
    Coulomb blockade; silicon; single electron transistors; transistor circuits; Coulomb blockade oscillation; analog pattern matching circuit; current switching; hole injection; integrated silicon single-electron transistor circuit; peak-to-valley current ratio; room-temperature demonstration; silicon single-hole transistors; Controllability; Fabrication; MOSFETs; Nanocrystals; Pattern matching; Silicon; Single electron transistors; Switches; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
  • Print_ISBN
    0-7803-8684-1
  • Type

    conf

  • DOI
    10.1109/IEDM.2004.1419104
  • Filename
    1419104