• DocumentCode
    29995
  • Title

    High-Reliability FPGA-Based Systems: Space, High-Energy Physics, and Beyond

  • Author

    Wirthlin, Michael

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
  • Volume
    103
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    379
  • Lastpage
    389
  • Abstract
    Field-programmable gate arrays (FPGAs) have been shown to provide high computational density and efficiency for many computing applications by allowing circuits to be customized to any application of interest. FPGAs also support programmability by allowing the circuit to be changed at a later time through reconfiguration. There is great interest in exploiting these benefits in space and other radiation environments. FPGAs, however, are very sensitive to radiation and great care must be taken to properly address the effects of radiation in FPGA-based systems. This paper will highlight the effects of radiation on FPGA-based systems and summarize the challenges in deploying FPGAs in such environments. Several well-known mitigation methods will be described and the unique ability of FPGAs to customize the system for improved reliability will be discussed. Finally, two case studies summarizing successful deployment of FPGAs in radiation environments will be presented.
  • Keywords
    fault tolerance; field programmable gate arrays; integrated circuit reliability; radiation hardening (electronics); fault-tolerant systems; field-programmable gate arrays; high-reliability FPGA-based systems; integrated circuit reliability; radiation effects; radiation hardening; Aerospace electronics; Computational efficiency; Field programmable gate arrays; Radiation effects; Random access memory; Reconfigurable architectures; Space vehicles; Fault-tolerant systems; field programmable gate arrays; integrated circuit reliability; radiation effects; radiation hardening;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2015.2404212
  • Filename
    7086415