Title :
Dynamic test signal design for analog ICs
Author :
Devarayanadurg, G. ; Soma, M.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
In this paper we present an approach to construct dynamic test signals for analog circuits. Using the integral measure for characterizing time-domain signals, we extend the minmax formulation of the static test problem to the dynamic case. A sub-optimal solution strategy, similar to dynamic programming methods is used to construct the test waveforms. The approach presented here may be used to construct input signals for an on-chip test scheme or for the selection of an external stimulus applied through an arbitrary waveform generator.
Keywords :
analogue integrated circuits; circuit CAD; integrated circuit testing; analog ICs; dynamic programming; dynamic test signals; external stimulus; integral measure; minmax formulation; on-chip test; static test problem; test waveforms; time-domain signals; waveform generator; Analog circuits; Circuit faults; Circuit testing; Contracts; Optimal control; Rails; Signal design; Switches; Time domain analysis; Voltage control;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.480194