DocumentCode
2999795
Title
Efficient Algorithms For Testing The Two-Level Carry Skip Adder
Author
Popescu, Daniela Elena ; Popescu, Corneliu
Author_Institution
Univ. of Oradea, Oradea
Volume
2
fYear
2006
fDate
6-9 Aug. 2006
Firstpage
319
Lastpage
322
Abstract
The paper is the result of the author´s activities concerning the testing and the design for testability for computer arithmetic systems. By applying the C-testability concept, we present a method of identifying a minimal complete set of test vectors for detecting all single stuck-at faults for the multi-level Carry Skip Adder (CSkA), together with our results.
Keywords
adders; carry logic; design for testability; fault diagnosis; logic testing; C-testability concept; computer arithmetic systems; multilevel carry skip adder; stuck-at faults; two-level carry skip adder testing; Adders; Bismuth; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Integrated circuit interconnections; Logic arrays; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location
San Juan
ISSN
1548-3746
Print_ISBN
1-4244-0172-0
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2006.382276
Filename
4267354
Link To Document