DocumentCode :
2999814
Title :
Characterization Of Gated Silicon Field Emission Micro Triodes
Author :
Liu, D. ; Marcus, R.B.
Author_Institution :
ERSO/ITRI
fYear :
1993
fDate :
12-15 Jul 1993
Firstpage :
52
Lastpage :
53
Keywords :
Chemical technology; Chemistry; Circuit testing; Current measurement; Microelectronics; Physics; Process control; Silicon; Voltage; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
Type :
conf
DOI :
10.1109/IVMC.1993.700269
Filename :
700269
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2999814
