Title :
JHDL Implementation of a BIST Scheme for Testing the Look-Up Tables of SRAM Based FPGAs
Author :
Niamat, M. ; Santhanam, S. ; Kim, J.
Author_Institution :
Dept. of Eng. Technol., Toledo Univ., Toledo, OH
Abstract :
Built in self test for FPGAs has become an important area of research over the years. The current research focuses on the use of JHDL as an implementation tool for BIST. The research spans the design, simulation and JHDL implementation of a BIST scheme for testing the Look-Up Tables of a Xilinx SRAM based Spartan II FPGA. To the best of our knowledge, this is the first attempt by any researcher in using JHDL for implementing BIST on FPGAs.
Keywords :
SRAM chips; built-in self test; field programmable gate arrays; integrated circuit design; integrated circuit testing; table lookup; BIST scheme; JHDL implementation; Xilinx SRAM based Spartan II FPGA; built-in-self test; integrated circuit design; integrated circuit testing; look-up tables; Automatic testing; Built-in self-test; Circuit testing; Design automation; Dynamic programming; Field programmable gate arrays; Hardware design languages; Integrated circuit interconnections; Java; Random access memory;
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2006.382278