• DocumentCode
    2999853
  • Title

    Fault emulation: a new approach to fault grading

  • Author

    Kwang-Ting Cheng ; Shi-Yu Huang ; Wei-Jin Dai

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1995
  • fDate
    5-9 Nov. 1995
  • Firstpage
    681
  • Lastpage
    686
  • Abstract
    In this paper, we propose a method of using an FPGA-based emulation system for fault grading. The real-time simulation capability of a hardware emulator could significantly improve the run-time of fault grading, which is one of the most resource-intensive tasks in the design process. A serial fault emulation algorithm is employed and enhanced by two speed-up techniques. First, a set of independent faults can be emulated in parallel. Second, simultaneous injection of multiple dependent faults is also possible by adding extra supporting circuitry. Because the reconfiguration time spent on mapping the numerous faulty circuits into the FPGA boards could be the bottleneck of the whole process, using extra logic for injecting a large number of faults per configuration can reduce the number of reconfigurations, and thus, significantly improve the efficiency. Some modeling issues that are unique in the fault emulation environment are also addressed. The performance estimation indicates that this approach could be several orders of magnitude faster than the existing software approaches for large designs.
  • Keywords
    circuit CAD; circuit analysis computing; digital simulation; electrical faults; field programmable gate arrays; FPGA boards; fault emulation; fault grading; faulty circuits; independent faults; multiple dependent faults; performance estimation; reconfiguration time; Circuit faults; Circuit simulation; Design for testability; Emulation; Field programmable gate arrays; Hardware; Logic design; Logic programming; Process design; Programmable logic arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-8186-8200-0
  • Type

    conf

  • DOI
    10.1109/ICCAD.1995.480203
  • Filename
    480203