DocumentCode :
2999853
Title :
Fault emulation: a new approach to fault grading
Author :
Kwang-Ting Cheng ; Shi-Yu Huang ; Wei-Jin Dai
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
1995
fDate :
5-9 Nov. 1995
Firstpage :
681
Lastpage :
686
Abstract :
In this paper, we propose a method of using an FPGA-based emulation system for fault grading. The real-time simulation capability of a hardware emulator could significantly improve the run-time of fault grading, which is one of the most resource-intensive tasks in the design process. A serial fault emulation algorithm is employed and enhanced by two speed-up techniques. First, a set of independent faults can be emulated in parallel. Second, simultaneous injection of multiple dependent faults is also possible by adding extra supporting circuitry. Because the reconfiguration time spent on mapping the numerous faulty circuits into the FPGA boards could be the bottleneck of the whole process, using extra logic for injecting a large number of faults per configuration can reduce the number of reconfigurations, and thus, significantly improve the efficiency. Some modeling issues that are unique in the fault emulation environment are also addressed. The performance estimation indicates that this approach could be several orders of magnitude faster than the existing software approaches for large designs.
Keywords :
circuit CAD; circuit analysis computing; digital simulation; electrical faults; field programmable gate arrays; FPGA boards; fault emulation; fault grading; faulty circuits; independent faults; multiple dependent faults; performance estimation; reconfiguration time; Circuit faults; Circuit simulation; Design for testability; Emulation; Field programmable gate arrays; Hardware; Logic design; Logic programming; Process design; Programmable logic arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-8186-8200-0
Type :
conf
DOI :
10.1109/ICCAD.1995.480203
Filename :
480203
Link To Document :
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