Title :
Resiliency Controlling of Wireless Sensor Networks for the Protecting from Internal Attacks
Author :
Huang, Xu ; Sharma, Dharmendra
Author_Institution :
Fac. of Inf. Sci. & Eng., Univ. of Canberra, Canberra, ACT, Australia
Abstract :
A wireless sensor network (WSN) has been making up of a mass of spatially distributed autonomous sensors to monitor physical or environmental conditions, such as sound, water contamination, temperature, pressure, motion and other pollutants. However, security threats to WSNs become increasingly diversified, prevention based due to the open nature of the wireless medium an adversary can easily eavesdrop and replay or inject fabricated messages. Different cryptographic methods can be used to defend against some of such attacks but very limited. For example, node compromise is another major problem of WSN security as it allows an adversary to enter inside the security perimeter of the network, which raised a serious challenge for WSNs. This paper is focusing on investigating internal attacks of wireless sensor networks with multi-hop and single sinker, by which we can show our novel algorithm with controllable resiliency of wireless sensor networks to ensure the targeted WSN working at the reasonable resiliency level. The final experimental works showed that the proposed algorithm does work well at the designed level.
Keywords :
cryptography; telecommunication security; wireless sensor networks; WSN security problem; cryptographic methods; environmental conditions; fabricated messages; internal attacks protection; multihop sinker; resiliency controlling; security threats; single sinker; spatially distributed autonomous sensors; wireless medium; wireless sensor networks; Cryptography; Equations; Mathematical model; Sensor phenomena and characterization; Wireless sensor networks; internal attacks; network security; resiliency of WSN; sensor optimum deployment; wireless sensor networks;
Conference_Titel :
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-0974-5
DOI :
10.1109/IPDPSW.2012.155