Title :
Alternating current bias-assisted photoenhanced oxidation of n-GaN in dionized water
Author :
Hsueh, T.H. ; Lai, W.C. ; Yeh, C.Y. ; Sheu, J.K. ; Peng, L.C. ; Chang, K.H. ; Wu, S.E. ; Liu, C.P. ; Gault, Baptiste ; Ringer, Simon P.
Author_Institution :
Inst. of Electro-Opt. Sci. & Eng., Nat. Cheng Kung Univ., Tainan
fDate :
July 28 2008-Aug. 1 2008
Abstract :
Patterned oxidation of n-GaN in water at room temperature is achieved by using an imprint technique and an alternating current (ac) bias-assisted photoelectrochemical process. Mold is fabricated by a double-side polished sapphire coated with indium tin oxide thin film to be an electrode for electric conduction and allow the high transparency for ultraviolet light. The growth rate of gallium oxide-based material of around 12 nm/min could be achieved when an ac bias of 3 V with a duty cycle of 90% was applied to the system. The film is determined by high-resolution transmission electron microscopy and selected area electron diffraction pattern.
Keywords :
electron diffraction; gallium compounds; indium compounds; oxidation; photoelectrochemistry; sapphire; tin compounds; transmission electron microscopy; water; wide band gap semiconductors; GaN; Patterned oxidation; alternating current bias-assisted photoenhanced oxidation; dionized water; double-side polished sapphire; electrode; gallium oxide-based material; high-resolution transmission electron microscopy; imprint technique; indium tin oxide thin film; photoelectrochemical process; selected area electron diffraction pattern; ultraviolet light; Design engineering; Etching; Gallium nitride; Indium tin oxide; Optical devices; Optical films; Oxidation; Substrates; Temperature; Voltage; GaN; photoenhanced chemical oxidation; water;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
Conference_Location :
Sydney, SA
Print_ISBN :
978-1-4244-2716-1
Electronic_ISBN :
1097-2137
DOI :
10.1109/COMMAD.2008.4802077