Title :
Enhanced ultraviolet photo-response of nanostructure zinc oxide (ZnO) thin film irradiated with pulsed laser
Author :
Gupta, Vinay ; Menon, Rashmi ; Sreenivas, K.
Author_Institution :
Dept. of Phys. & Astrophys., Univ. of Delhi, Delhi
fDate :
July 28 2008-Aug. 1 2008
Abstract :
Ultravoilet (UV) photodetectors have been fabricated by rf magnetron sputtered ZnO films. The average grain size of ZnO films were 15-20 nm. Photo-response (Ion/Ioff) of as-grown ZnO film of thickness 100 nm was maximum (3.8 times 103) having relatively small response time ~90 ms for UV intensity of 140 muW/cm2 (lambda= 365 nm). ZnO films were irradiated by pulsed Nd:YAG laser corresponding to both fundamental wavelength (1064 nm) and forth harmonics (266 nm) to modify its defects profiles. Response was found to increase with increasing number of irradiating pulses upto 6000, and thereafter starts decreasing. Laser (lambda=266 nm) irradiated detector exhibits enhanced response (3.7 times 104) with fast response speed (30 ms), showing its promising application for detection of low intensity UV photons.
Keywords :
II-VI semiconductors; grain size; laser beam effects; nanostructured materials; photodetectors; semiconductor thin films; ultraviolet detectors; wide band gap semiconductors; zinc compounds; ZnO; enhanced ultraviolet photo-response; fast response speed; grain size; nanostructure zinc oxide thin film; pulsed laser irradiation; size 100 nm; ultraviolet photodetectors; wavelength 1064 nm; wavelength 365 nm; Optical pulses; Optical surface waves; Photodetectors; Pulsed laser deposition; Sputtering; Surface emitting lasers; Surface morphology; Temperature; Transistors; Zinc oxide; Laser irradiation; Sputtering; UV detector; ZnO films;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
Conference_Location :
Sydney, SA
Print_ISBN :
978-1-4244-2716-1
Electronic_ISBN :
1097-2137
DOI :
10.1109/COMMAD.2008.4802091