Title :
Study of DEA Evaluation of Efficiency of Enterprise Knowledge Innovation Network
Author :
Bai Li ; Zhang Jing-xiao ; Luo Lan ; Li, Bai
Author_Institution :
Sch. of Manage., Xi´´an Univ. of Arch. & Tech., Xi´´an, China
Abstract :
At present, evaluating the efficiency of enterprise knowledge innovation network (EKIN) are not yet given the enough attention. Based on the existed results from experts, combined with social networking features. The paper performs evaluating efficiency of EKIN by means of adopting seven indexes according to the principles of science, representation and feasibility, namely attention degree of cooperation and R&D, connection degree of network, ways and channels of communication at respective node, trust degree of alliance members, intensity of information flow, degree of damage, structural hole degree of network. At the same time, the data envelopment analysis (DEA) method has been introduced on the basis of the index system of evaluating efficiency empirically analyzes whether EKIN of fourteen enterprises achieve scale and technical effectiveness or not, and orders the effective evaluation units by means of the system of antagonistic cross evaluation and proposes measures of improvement for ineffective units with the application of the projection principle, all of which will be beneficial to promoting efficiency and competitiveness of innovation network.
Keywords :
business data processing; data envelopment analysis; innovation management; knowledge management; social networking (online); DEA evaluation; antagonistic crossevaluation; data envelopment analysis method; enterprise knowledge innovation network; information flow; network connection degree; network. structural hole degree; social networking feature; technical effectiveness; Analytical models; Data envelopment analysis; Indexes; Knowledge engineering; Personnel; Technological innovation; Cross-evaluation; Data Envelopment Analysis (DEA); Enterprise Knowledge Management; Innovation Network;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.1155