Title :
Investigation of field-plate gate on heterojunction doped-channel field effect transistors
Author :
Hsu, Meng-Kai ; Chiu, Shao-Yen ; Wu, Chung-Hsien ; Liu, Kang-Ping ; Tsai, Jung-Hui ; Lour, Wen-Shiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Ocean Univ., Keelung
fDate :
July 28 2008-Aug. 1 2008
Abstract :
In this work, we report a metal-splitting field plate gate on heterojunction doped-channel field effect transistors (HDCFETs) with an application of GaAs-bulk. Experimentally, a HDCFET with a gate-metal length of 0.4 mum, a field-plate length of 0.6 mum, and a bulk thickness of 120 nm was successfully fabricated for comparing to that with a 1-mum traditional planar-gate. The current density (451 mA/mm), transconductance (225 mS/mm), breakdown voltages (VBD(DS)/VBD(GD)=22/-25.5 V), gate-voltage swing (2.24 V), unity current-gain and power-gain frequencies (ft/fmax=17.2/32 GHz) are improved as compared to those of 1-mum gate device without field plates. At 1.8 GHz with a VDS of 4.0 V operation, a maximum power-added efficiency (PAE) of 36% with an output power of 13.9 dBm and a power gain of 8.7 dB was obtained. Saturated output power and linear power gain are 316 mW/mm and 13 dB, respectively.
Keywords :
III-V semiconductors; UHF field effect transistors; gallium arsenide; semiconductor heterojunctions; GaAs; HDCFET; field-plate gate; frequency 1.8 GHz; gate-metal length; heterojunction doped-channel field effect transistor; size 0.4 mum; size 0.6 mum; size 120 nm; FETs; Fabrication; Gain; Gallium arsenide; Heterojunctions; Insulation; Microwave devices; Power generation; Resists; Schottky barriers; Field-Plate Gate; HDCFET; Metal-Splitting;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
Conference_Location :
Sydney, SA
Print_ISBN :
978-1-4244-2716-1
Electronic_ISBN :
1097-2137
DOI :
10.1109/COMMAD.2008.4802102