DocumentCode :
3001135
Title :
Unsupervised feature optimization (UFO): Simultaneous selection of multiple features with their detection parameters
Author :
Karlinsky, Leonid ; Dinerstein, Michael ; Ullman, Shimon
Author_Institution :
Weizmann Inst. of Sci., Rehovot, Israel
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
1263
Lastpage :
1270
Abstract :
Class learning, both supervised and unsupervised, requires feature selection, which includes two main components. The first is the selection of a discriminative subset of features from a larger pool. The second is the selection of detection parameters for each feature to optimize classification performance. In this paper we present a method for the discovery of multiple classification features, their detection parameters and their consistent configurations, in the fully unsupervised setting. This is achieved by a global optimization of joint consistency between the features as a function of the detection parameters, without assuming any prior parametric model. We demonstrate how the proposed framework can be applied for learning different types of feature parameters, such as detection thresholds and geometric relations, resulting in the unsupervised discovery of informative configurations of objects parts. We test our approach on a wide range of classes and show good results. We also demonstrate how the approach can be used to unsupervisedly separate and learn visually similar sub-classes of a single category, such as facial views or hand poses. We use the approach to compare various criteria for feature consistency, including Mutual Information, Suspicious Coincidence, L2 and Jaccard index. Finally, we compare our approach to aparametric consistency optimization technique such as pLSA and show significantly better performance.
Keywords :
image classification; object detection; unsupervised learning; Jaccard index; L2 index; Mutual Information; class learning; detection parameters; discriminative subset; feature consistency; feature selection; global optimization; informative configurations; multiple classification features; multiple features; supervised learning; suspicious coincidence; unsupervised feature optimization; unsupervised learning; Computer vision;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206499
Filename :
5206499
Link To Document :
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