Title :
Low Cost RF Signal Generation for BIST
Author :
Negreiros, Marcelo ; Michels, Álisson M. ; Carro, Luigi ; Susin, Altamiro A.
Author_Institution :
Dept. of Electr. Eng., Fed. Univ. of Rio Grande do Sul, Porto Alegre
Abstract :
In this work a low cost approach for the generation of RF test signals for analog BIST is proposed. As a single bit signal is generated and applied to the RF path, only a single bit DA converter is needed. The approach takes advantage of the limited bandwidth in RF signal paths. Analysis of the proposed technique and comparison to other approaches are provided Simulation and practical results illustrate the performance of the proposed signal generation method.
Keywords :
analogue integrated circuits; built-in self test; digital-analogue conversion; integrated circuit testing; radiofrequency integrated circuits; RF analog circuits; RF signal paths; RF test signal generation method; analog BIST; built-in self test; low cost approach; single bit DA converter; single bit generators; system-on-chip environment; Analytical models; Bandwidth; Built-in self-test; Costs; Performance analysis; RF signals; Radio frequency; Signal analysis; Signal generators; Testing;
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2006.381814
