DocumentCode :
3001361
Title :
The paradox of compensated silicon
Author :
Cuevas, Andres
Author_Institution :
Dept. of Eng., The Australian Nat. Univ., Canberra, ACT
fYear :
2008
fDate :
July 28 2008-Aug. 1 2008
Firstpage :
238
Lastpage :
241
Abstract :
Compensated doping is typical of upgraded metallurgical silicon. The relatively low carrier mobility associated to high concentrations of both acceptors and donors leads to paradoxical effects on solar cell performance. While the short-circuit current is expected to decrease compared to non-compensated silicon of the same resistivity, the open-circuit voltage is predicted to increase when bulk recombination is the dominant loss mechanism. On the other hand, surface recombination is predicted to have a greater impact on compensated Si wafers and to result in a lower effective carrier lifetime. These effects are important to understand measurements of compensated Si wafers and devices.
Keywords :
carrier lifetime; carrier mobility; elemental semiconductors; semiconductor doping; silicon; solar cells; surface recombination; Si; acceptors; bulk recombination; carrier mobility; compensated silicon; dominant loss mechanism; donors; doping; effective carrier lifetime; open-circuit voltage; short-circuit current; solar cell performance; surface recombination; Boron; Charge carrier lifetime; Charge carrier processes; Conductivity; Crystalline materials; Doping; Electron mobility; Photovoltaic cells; Semiconductor process modeling; Silicon; compensated silicon; silicon solar cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
Conference_Location :
Sydney, SA
ISSN :
1097-2137
Print_ISBN :
978-1-4244-2716-1
Electronic_ISBN :
1097-2137
Type :
conf
DOI :
10.1109/COMMAD.2008.4802135
Filename :
4802135
Link To Document :
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