• DocumentCode
    3001361
  • Title

    The paradox of compensated silicon

  • Author

    Cuevas, Andres

  • Author_Institution
    Dept. of Eng., The Australian Nat. Univ., Canberra, ACT
  • fYear
    2008
  • fDate
    July 28 2008-Aug. 1 2008
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    Compensated doping is typical of upgraded metallurgical silicon. The relatively low carrier mobility associated to high concentrations of both acceptors and donors leads to paradoxical effects on solar cell performance. While the short-circuit current is expected to decrease compared to non-compensated silicon of the same resistivity, the open-circuit voltage is predicted to increase when bulk recombination is the dominant loss mechanism. On the other hand, surface recombination is predicted to have a greater impact on compensated Si wafers and to result in a lower effective carrier lifetime. These effects are important to understand measurements of compensated Si wafers and devices.
  • Keywords
    carrier lifetime; carrier mobility; elemental semiconductors; semiconductor doping; silicon; solar cells; surface recombination; Si; acceptors; bulk recombination; carrier mobility; compensated silicon; dominant loss mechanism; donors; doping; effective carrier lifetime; open-circuit voltage; short-circuit current; solar cell performance; surface recombination; Boron; Charge carrier lifetime; Charge carrier processes; Conductivity; Crystalline materials; Doping; Electron mobility; Photovoltaic cells; Semiconductor process modeling; Silicon; compensated silicon; silicon solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
  • Conference_Location
    Sydney, SA
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4244-2716-1
  • Electronic_ISBN
    1097-2137
  • Type

    conf

  • DOI
    10.1109/COMMAD.2008.4802135
  • Filename
    4802135