Title :
A framework for standard modular simulation in semiconductor wafer fabrication systems
Author :
Ramírez-Hernández, José A. ; Li, Heshan ; Fernandez, Emmanuel ; McLean, Charles ; Leong, Swee
Author_Institution :
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
Abstract :
This paper presents the application of a framework, proposed by the National Institute of Standards and Technology (NIST), for standard modular simulation in semiconductor wafer fabrication facilities (fabs). The application of the proposed framework resulted in the identification and specification of four different elements in the context of semiconductor fabs: (1) market sector, (2) hierarchical modeling levels, (3) simulation case studies, (4) models and data. An example of the application of the proposed simulation framework to a benchmark semiconductor fab model, the so-called Mini-fab, is presented. In this example, evaluation of production performance under different workforces is studied. Current and future research is focused on the improvement of the proposed framework (e.g., design and testing of generic case studies).
Keywords :
production facilities; semiconductor device manufacture; semiconductor process modelling; standards; National Institute of Standards and Technology; semiconductor wafer fabrication systems; standard modular simulation; Computational modeling; Context modeling; Fabrication; Manufacturing industries; Manufacturing systems; NIST; Semiconductor device manufacture; Semiconductor device modeling; Standardization; Virtual manufacturing;
Conference_Titel :
Simulation Conference, 2005 Proceedings of the Winter
Print_ISBN :
0-7803-9519-0
DOI :
10.1109/WSC.2005.1574502