Title :
Fault-tolerant design of a classical voltage-source inverter using z-source and standby redundancy
Author :
Cordeiro, Armando ; Palma, João ; Maia, José ; Resende, Maria
Author_Institution :
ISEL - Inst. Super. de Eng. de Lisboa (ADESPA), Lisbon, Portugal
Abstract :
This paper proposes modifications of the classical two-level three-phase voltage-source inverter topology structure with the aim of increasing its reliability to safety-critical applications. This solution intends to achieve fast changing and “soft” commutation between main and redundant branches through the combination of mechanical commutators and power devices. Also, important modifications in the power supply stage will allow to withstand severe short-circuit conditions. With those modifications, the energy processing capability can be maintained for most common failure modes. Several aspects of failure modes, detection and isolation processes within voltage-source inverters are also discussed regarding the requirements of safety related applications. Experimental results from a prototype are included to confirm the validity of the proposed solution.
Keywords :
commutators; failure analysis; fault tolerance; invertors; isolation technology; network topology; power electronics; redundancy; short-circuit currents; Z-source; classical two-level three-phase voltage-source inverter topology structure; energy processing capability; failure mode; fault-tolerant design; isolation process; mechanical commutator; power device; power supply stage; redundant branch; safety related application; safety-critical application; short-circuit condition; standby redundancy; Circuit faults; Fault tolerance; Fault tolerant systems; Insulated gate bipolar transistors; Inverters; Semiconductor diodes; Switches; IGBT failure; Z-source; converter redundancy; fault-tolerant inverter; mechanical commutator; power electronics reliability; voltage-source inverter (VSI);
Conference_Titel :
Electrical Power Quality and Utilisation (EPQU), 2011 11th International Conference on
Conference_Location :
Lisbon
Print_ISBN :
978-1-4673-0379-8
DOI :
10.1109/EPQU.2011.6128858