DocumentCode :
3001527
Title :
An algorithm for diagnostics with signature analyzer
Author :
Chan, John C. ; Womack, Baxter F.
Author_Institution :
IBM Corp., Austin, TX, USA
fYear :
1990
fDate :
13-15 Feb 1990
Firstpage :
69
Lastpage :
74
Abstract :
An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of `don´t cares´ at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner
Keywords :
computer testing; error detection; fault location; logic analysers; logic testing; probability; signal processing equipment; algorithm; aliasing; board level testing; combinational circuit; computer testing; error detection; error locations; fault diagnosis; fault isolation; matching tests; probability; signature analyzer; Algorithm design and analysis; Circuit faults; Circuit testing; Computer errors; Fault detection; Fault diagnosis; Hardware; Performance evaluation; Polynomials; Sequential analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/IMTC.1990.65963
Filename :
65963
Link To Document :
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