• DocumentCode
    3001538
  • Title

    Interconnect-Driven Nanoelectronic Circuits

  • Author

    Haruehanroengra, Sansiri ; Chen, D. ; Wang, Wei

  • Author_Institution
    Indiana Univ.-Purdue Univ. Indianapolis, Indianapolis
  • Volume
    2
  • fYear
    2006
  • fDate
    6-9 Aug. 2006
  • Firstpage
    694
  • Lastpage
    698
  • Abstract
    The future of the hundred billion dollar semiconductor industry relies on novel nanoelectronic devices and circuits as well as new design approaches. In this paper, a novel interconnect-driven design method is proposed to build practical nanoelectronic circuits using nickel silicide (NiSi) nanowires. This interconnect-driven approach is to design nanoelectronic circuits by selecting efficient interconnect solution first, and then determining the appropriate logic style and material for the circuit based on the interconnect. By focusing on the interconnect bottleneck, rather than devices per se, this proposed solution would significantly improve the feasibility and overall performance of the nanoelectronic circuit. The interconnect-driven approach and NiSi nanowire are a perfect match. Using the interconnect-driven approach, NiSi nanowire and NiSi/Si transistors can form efficient interconnects, pseudo logics and hybrid circuits. This complete interconnect/circuit solution can be achieved by integrating both active devices and high-performance interconnects in a single NiSi nanowire building block.
  • Keywords
    integrated circuit interconnections; integrated circuit manufacture; nanoelectronics; nanowires; nickel compounds; silicon compounds; NiSi; interconnect bottleneck; interconnect-driven nanoelectronic circuits; nickel silicide nanowires; semiconductor industry; Design methodology; Electronics industry; Integrated circuit interconnections; Logic circuits; Logic design; Logic devices; Nanoscale devices; Nanowires; Nickel; Silicides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
  • Conference_Location
    San Juan
  • ISSN
    1548-3746
  • Print_ISBN
    1-4244-0172-0
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2006.381826
  • Filename
    4267450