DocumentCode :
3001580
Title :
3D morphable face models revisited
Author :
Patel, Anup ; Smith, William A. P.
Author_Institution :
Dept. of Comput. Sci., Univ. of York, York, UK
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
1327
Lastpage :
1334
Abstract :
In this paper we revisit the process of constructing a high resolution 3D morphable model of face shape variation. We demonstrate how the statistical tools of thin-plate splines and Procrustes analysis can be used to construct a morphable model that is both more efficient and generalises to novel face surfaces more accurately than previous models. We also reformulate the probabilistic prior that the model provides on the distribution of parameter vector lengths. This distribution is determined solely by the number of model dimensions and can be used as a regularisation constraint in fitting the model to data without the need to empirically choose a parameter controlling the trade off between plausibility and quality of fit. As an example application of this improved model, we show how it may be fitted to a sparse set of 2D feature points (approximately 100). This provides a rapid means to estimate high resolution 3D face shape for a face in any pose given only a single face image. We present experimental results using ground truth data and hence provide absolute reconstruction errors. On average, the per vertex error of the reconstructed faces is less than 3.6 mm.
Keywords :
face recognition; image morphing; image reconstruction; probability; shape recognition; solid modelling; splines (mathematics); statistical analysis; 3D face shape; 3D morphable face models; Procrustes analysis; face shape variation; parameter vector lengths; probabilistic prior; reconstruction errors; regularisation constraint; single face image; statistical tools; thin-plate splines; Computer science; Face recognition; Image recognition; Image reconstruction; Image resolution; Lighting; Reflectivity; Robustness; Shape; Surface fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206522
Filename :
5206522
Link To Document :
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