Title :
Fabrication of Cu(InGa)Se2 thin-film solar cells grown with ionized Ga source
Author :
Nakashiba, Tetusya ; Yamada, Akira ; Zhang, Li ; Konagai, Makoto
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo
fDate :
July 28 2008-Aug. 1 2008
Abstract :
Polycrystalline Cu(InGa)Se2 (CIGS) thin films have been grown onto a soda-lime glass substrate by the co-evaporation process using ionized Ga. It was found from the XRD and Raman measurements that the crystallinity of the films grown with ionized Ga was equivalent to the films grown with normal Ga. In addition, a reduction of defect densities measured by the admittance spectroscopy and the improvement of the reverse saturation current assessed by the I-V characteristics were observed in the films grown with ionized Ga, implying an improvement of film quality. Furthermore, an enlargement of grain size was shown. Finally, the CIGS solar cell with a promising efficiency of 15.1% has been achieved by using the ionized Ga source.
Keywords :
Raman spectra; X-ray diffraction; copper compounds; crystal defects; electric admittance measurement; gallium compounds; grain size; indium compounds; molecular beam epitaxial growth; semiconductor growth; semiconductor thin films; solar cells; ternary semiconductors; Cu(InGa)Se2; I-V characteristics; Raman measurement; XRD; admittance spectroscopy; co-evaporation process; crystallinity; defect density; grain size; ionized Ga source; polycrystalline thin films; reverse saturation current; soda-lime glass substrate; thin-film solar cells; Admittance measurement; Crystallization; Current measurement; Density measurement; Fabrication; Glass; Spectroscopy; Substrates; Transistors; X-ray scattering; Cu(InGa)Se2; Photovoltaics; component; solar cells;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
Conference_Location :
Sydney, SA
Print_ISBN :
978-1-4244-2716-1
Electronic_ISBN :
1097-2137
DOI :
10.1109/COMMAD.2008.4802147