• DocumentCode
    3001935
  • Title

    An approach to behavioral synthesis for loop-based BIST

  • Author

    Li, Xiaowei ; Cheung, Paul Y S

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Peking Univ., Beijing, China
  • Volume
    6
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    374
  • Abstract
    This paper presents an approach to behavioral synthesis for loop-based BIST. By taking into account the requirements of the BIST scheme during behavioral synthesis processes, an area optimal BIST solution can be obtained. This approach is based on the use of rest resources reusability which results in a fewer number of registers being modified as BIST registers. This is achieved by incorporating testability constraints during register assignment operations. Experimental results on benchmarks are presented to demonstrate the effectiveness of the approach
  • Keywords
    built-in self test; integrated circuit design; logic design; shift registers; BIST registers; behavioral synthesis; benchmarks; effectiveness; loop-based BIST; optimal BIST; resources reusability; testability constraints; Benchmark testing; Built-in self-test; Circuit synthesis; Circuit testing; Computer science; Concurrent computing; Hardware; Minimization; Registers; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.780173
  • Filename
    780173