Title :
Macrocell placement with temperature profile optimization
Author :
Tsai, Ching-Han ; Kang, Sung-Mo Steve
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
With the dramatic increase of power consumption by modern high-performance circuits, cross-chip temperature differentials as large as 10~20 degrees have been commonly observed. It is thus imperative to address the thermal issue as early in the design process as possible, to avoid the associated performance and reliability problems. In this paper we present a temperature sensitive macro cell placement tool aiming at improving the quality of the temperature distribution of a circuit design. Our placement tool uses the concept of transfer thermal resistance and the principle of superposition to calculate the optimal power and temperature distributions under the given power budget and boundary conditions, and to efficiently update incremental temperature profile changes during the placement process. The tool has been tested with several benchmark circuits. Simulation results show good compatibility with conventional physical design constraints, with noticeable improvements on the final temperature profile and very little area increase
Keywords :
VLSI; circuit CAD; circuit optimisation; integrated circuit layout; integrated circuit reliability; simulated annealing; temperature distribution; thermal resistance; VLSI; benchmark circuits; boundary conditions; circuit design; cross-chip temperature differentials; design; incremental temperature profile; macro cell placement; optimal power; performance; power budget; reliability; simulation; substrate temperature; superposition; temperature distribution; temperature profile optimization; transfer thermal resistance; Benchmark testing; Boundary conditions; Circuit synthesis; Circuit testing; Energy consumption; Macrocell networks; Process design; Temperature distribution; Temperature sensors; Thermal resistance;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.780177