DocumentCode :
3002108
Title :
0.25 μm emitter InP SHBTs with fT = 550 GHz and BVCEO > 2V
Author :
Hafez, Walid ; Feng, Milton
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
2004
fDate :
13-15 Dec. 2004
Firstpage :
549
Lastpage :
552
Abstract :
This paper report DC and RF characteristics of InP single heterojunction bipolar transistors (SHBTs) exhibiting ultrahigh cut-off frequencies of fT = 550 GHz and fMAX = 255 GHz, with BVCEO = 2.1 V. The devices exhibit record fT performance of bipolar transistors at operating current densities in excess of 19 mA/μm2, achieved through the use of a vertically scaled epitaxial structure featuring a 20 nm base and a lightly-doped 65 nm InGaAs collector. Thermal resistance calculations for a 0.25×8 μm2 device yield an RTH= 5.1°C/mW, corresponding to a ΔTj = 173°C at 34 mW of power dissipation at peak operating conditions.
Keywords :
III-V semiconductors; current density; heterojunction bipolar transistors; submillimetre wave integrated circuits; 0.25 micron; 173 C; 2.1 V; 20 nm; 34 mW; 550 GHz; 65 nm; DC characteristics; InP-InGaAs; RF characteristics; SHBT; current densities; single heterojunction bipolar transistors; thermal resistance; ultra high cut-off frequencies; vertically scaled epitaxial structure; Breakdown voltage; Current density; Cutoff frequency; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Kirk field collapse effect; Knee; Lithography; Planarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-8684-1
Type :
conf
DOI :
10.1109/IEDM.2004.1419217
Filename :
1419217
Link To Document :
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