DocumentCode :
3002120
Title :
First demonstration of sub-0.25μm-width emitter InP-DHBTs with > 400 GHz ft and > 400 GHz fmax
Author :
Hussain, T. ; Royter, Y. ; Hitko, D. ; Montes, M. ; Madhav, M. ; Milosavljevic, I. ; Rajavel, R. ; Thomas, S. ; Antcliffe, M. ; Arthur, A. ; Boegeman, Y. ; Sokolich, M. ; Li, J. ; Asbeck, P.
Author_Institution :
HRL Labs., LLC, Malibu, CA, USA
fYear :
2004
fDate :
13-15 Dec. 2004
Firstpage :
553
Lastpage :
556
Abstract :
We report performance of sub-0.25μm emitter-width InP/InGaAs/InP DHBTs. These are the smallest emitter-width III-V devices reported to date. Measured ft/fmax performance of 406GHz/423GHz is the first ever reported for a sub-0.25μm emitter-width DHBT and among the fastest for any DHBTs. With the peak ft and fmax performance occurring at Ic = 8mA (Vce ∼ 1.25V), this is the lowest power consumption DHBT ever reported with state of the art cutoff frequencies. The as-patterned emitter contact metal width for these devices was 0.25 μm and the width of the emitter at the emitter-base junction is less than 0.25 μm owing to undercutting of the underlying emitter semiconductor. When comparing with 0.4 μm emitter width DHBTs, we find that 0.4 μm device has the higher measured ft, ∼ 420GHz, due to the lower emitter resistance for that emitter layout. Fmax was highest for the 0.25μm emitter devices due to lower base-collector mesa capacitance, Cbc, which results from the reduced mesa width. We find this behavior to be consistent with scaling tradeoffs in the design of ultra-fast DHBTs.
Keywords :
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; indium compounds; integrated circuit layout; power consumption; submillimetre wave integrated circuits; 0.25 micron; 400 GHz; III-V devices; InP-InGaAs-InP; cutoff frequencies; emitter contact metal width; emitter layout; emitter-base junction; mesa capacitance; power consumption; smallest emitter-width; ultra-fast DHBT; Capacitance; Circuits; Contact resistance; Cutoff frequency; Double heterojunction bipolar transistors; Electrical resistance measurement; Electrons; Energy consumption; Indium phosphide; Laboratories;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-8684-1
Type :
conf
DOI :
10.1109/IEDM.2004.1419218
Filename :
1419218
Link To Document :
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