DocumentCode :
3002154
Title :
Reliability analysis of warm standby systems using sequential BDD
Author :
Tannous, Ola ; Xing, Liudong ; Dugan, Joanne Bechta
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts (UMass), Dartmouth, MA, USA
fYear :
2011
fDate :
24-27 Jan. 2011
Firstpage :
1
Lastpage :
7
Abstract :
Warm standby sparing is a fault-tolerant design technique developed as a compromise between cold sparing and hot sparing approaches in terms of power consumption and recovery time. Warm spares have time-dependent failure behavior; before and after they are used to replace a faulty component, warm spares have different failure rates or in general failure distributions. Existing approaches for analyzing systems with warm spares typically require long computation time especially when results with high degree of accuracy are desired, and/or require exponential time-to-failure distribution for system components. In this paper, an analytical method is proposed for the reliability analysis of warm standby sparing systems. The proposed approach is based on the combinatorial model of sequential binary decision diagrams, and can generate accurate system reliability results for large systems. The approach is applicable to any type of time-to-failure distributions for the system components. Application and advantages of the proposed approach are illustrated using several examples.
Keywords :
binary decision diagrams; fault trees; cold sparing; fault tolerant design; hot sparing; power consumption; recovery time; reliability analysis; sequential BDD; sequential binary decision diagram; system component; time-dependent failure behavior; time-to-failure distribution; warm standby sparing system; Boolean functions; Computational modeling; Data structures; Fault trees; Logic gates; Markov processes; Reliability; dynamic fault tree (DFT); sequential binary decision diagram (SBDD); warm spare;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location :
Lake Buena Vista, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4244-8857-5
Type :
conf
DOI :
10.1109/RAMS.2011.5754426
Filename :
5754426
Link To Document :
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