DocumentCode :
3002204
Title :
A robust parametric method for bias field estimation and segmentation of MR images
Author :
Chunming Li ; Gatenby, Chris ; Li Wang ; Gore, John C.
Author_Institution :
Vanderbilt Univ. of Imaging Sci., Nashville, TN, USA
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
218
Lastpage :
223
Abstract :
This paper proposes a new energy minimization framework for simultaneous estimation of the bias field and segmentation of tissues for magnetic resonance images. The bias field is modeled as a linear combination of a set of basis functions, and thereby parameterized by the coefficients of the basis functions. We define an energy that depends on the coefficients of the basis functions, the membership functions of the tissues in the image, and the constants approximating the true signal from the corresponding tissues. This energy is convex in each of its variables. Bias field estimation and image segmentation are simultaneously achieved as the result of minimizing this energy. We provide an efficient iterative algorithm for energy minimization, which converges to the optimal solution at a fast rate. A salient advantage of our method is that its result is independent of initialization, which allows robust and fully automated application. The proposed method has been successfully applied to 3-Tesla MR images with desirable results. Comparisons with other approaches demonstrate the superior performance of this algorithm.
Keywords :
biological tissues; biomedical MRI; image segmentation; iterative methods; medical image processing; 3-Tesla MR images; bias field estimation; energy minimization framework; image segmentation; iterative algorithm; magnetic resonance images; membership functions; robust parametric method; tissue segmentation; Image analysis; Image converters; Image segmentation; Iterative algorithms; Magnetic analysis; Magnetic resonance; Magnetic resonance imaging; Minimization methods; Robustness; Smoothing methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206553
Filename :
5206553
Link To Document :
بازگشت