DocumentCode :
3002329
Title :
AC-photoconductivity of amorphous gallium phosphide (a-GaP) formed by nitrogen ion beam assisted deposition
Author :
Kubota, Hiroshi ; Tashiro, Tomohiro ; Hiyayu, Tsuyoshi ; Chikushima, Takayuki ; Fujiyoshi, Takanori ; Miyagawa, Ryuji ; Onuki, Masami
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Kumamoto Univ., Japan
Volume :
2
fYear :
1994
fDate :
5-9 Dec 1994
Firstpage :
1814
Abstract :
Because amorphous III-V compounds have various localized states that play important roles in carrier trapping and scattering centers, and strongly degrade electrical performance, the formation process for a-GaP is considered for reducing these states, effectively and selectively. We report in this paper that the valence-band tail state has successfully disappeared by using nitrogen ion-beam-assisted deposition, and then the mobility band gap has expanded to the 3 eV range. The gap states are also cleared for a-GaP:N according to accurate AC photoconductivity technique
Keywords :
III-V semiconductors; amorphous semiconductors; electron traps; energy gap; gallium compounds; high-frequency effects; ion beam applications; photoconductivity; semiconductor growth; semiconductor thin films; vacuum deposition; valence bands; 3 eV; AC-photoconductivity; GaP; a-GaP; amorphous III-V compound; amorphous gallium phosphide; carrier trapping; electrical performance; gap states; localized states; mobility band gap; nitrogen ion beam assisted deposition; scattering centers; valence-band tail state; Amorphous materials; Degradation; Electron beams; Gallium compounds; III-V semiconductor materials; Ion beams; Ion sources; Nitrogen; Optical scattering; Orifices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
Type :
conf
DOI :
10.1109/WCPEC.1994.520656
Filename :
520656
Link To Document :
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