DocumentCode :
3002394
Title :
An improved modular approach for dynamic fault tree analysis
Author :
Yevkin, Olexandr
Author_Institution :
R&D Dept., Dyadem Int. Ltd., Toronto, ON, Canada
fYear :
2011
fDate :
24-27 Jan. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Modularization technique allows efficient simplification of Dynamic and Static Fault Tree (FT). Each independent sub-tree (module) in static FT can be calculated separately and substituted by a basic event with obtained probability of failure. However, there is a significant restriction of this procedure in Dynamic FT, if it is converted to a Markov Chain. An independent sub-tree inside of Dynamic FT cannot be converted to basic event in general case, because corresponding Failure Rate (FR) is not constant and is not defined at arbitrary time. In the present paper we consider a set of cases when this modularization technique is still possible inside a Dynamic FT.
Keywords :
Markov processes; fault trees; probability; Markov chain; dynamic fault tree analysis; failure probability; failure rate; independent sub-tree; modularization technique; static fault tree; Approximation methods; Differential equations; Discrete Fourier transforms; Fault trees; Logic gates; Markov processes; Reliability; dynamic fault tree; modular approach; system reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location :
Lake Buena Vista, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4244-8857-5
Type :
conf
DOI :
10.1109/RAMS.2011.5754437
Filename :
5754437
Link To Document :
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