Abstract :
The following topics are dealt with: network-on-chip; test issues; application design; architectural and logic synthesis; low power design; fault modelling; system-on-chip; design verification; reconfigurable computing; embedded system; and mechatronics.
Keywords :
embedded systems; fault diagnosis; integrated circuit testing; logic design; reconfigurable architectures; system-on-chip; application design; architectural synthesis; design verification; embedded system; fault modelling; logic synthesis; low power design; mechatronics; network-on-chip; reconfigurable computing; system-on-chip; test issues;
Conference_Titel :
Design and Test Workshop, 2008. IDT 2008. 3rd International
Conference_Location :
Monastir
Print_ISBN :
978-1-4244-3479-4
DOI :
10.1109/IDT.2008.4802445
