Title :
Global connectivity potentials for random field models
Author :
Nowozin, Sebastian ; Lampert, Christoph H.
Author_Institution :
Max Planck Inst. for Biol. Cybern., Tubingen, Germany
Abstract :
Markov random field (MRF, CRF) models are popular in computer vision. However, in order to be computationally tractable they are limited to incorporate only local interactions and cannot model global properties, such as connectedness, which is a potentially useful high-level prior for object segmentation. In this work, we overcome this limitation by deriving a potential function that enforces the output labeling to be connected and that can naturally be used in the framework of recent MAP-MRF LP relaxations. Using techniques from polyhedral combinatorics, we show that a provably tight approximation to the MAP solution of the resulting MRF can still be found efficiently by solving a sequence of max-flow problems. The efficiency of the inference procedure also allows us to learn the parameters of a MRF with global connectivity potentials by means of a cutting plane algorithm. We experimentally evaluate our algorithm on both synthetic data and on the challenging segmentation task of the PASCAL VOC 2008 data set. We show that in both cases the addition of a connectedness prior significantly reduces the segmentation error.
Keywords :
Markov processes; computer vision; graph theory; image segmentation; inference mechanisms; learning (artificial intelligence); linear programming; maximum likelihood estimation; random processes; CRF; MAP-MRF LP relaxation; Markov random field; computer vision; conditional random field; cutting plane algorithm; global connectivity potential; graph theory; inference procedure; local interaction; machine learning; max-flow problem; object segmentation; output labeling; polyhedral combinatorics; Biological system modeling; Computer vision; Cybernetics; Feature extraction; Inference algorithms; Labeling; Linear programming; Markov random fields; Maximum a posteriori estimation; Vectors;
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-3992-8
DOI :
10.1109/CVPR.2009.5206567