• DocumentCode
    3002593
  • Title

    Fault prediction by utilizing self-organizing Map and Threshold

  • Author

    Abaei, Golnoush ; Rezaei, Zahra ; Selamat, Ali

  • Author_Institution
    Intell. Software Eng. Lab., Univ. Technol. Malaysia, Skudai, Malaysia
  • fYear
    2013
  • fDate
    Nov. 29 2013-Dec. 1 2013
  • Firstpage
    465
  • Lastpage
    470
  • Abstract
    Predicting parts of the programs that are more defects prone could ease up the software testing process, which leads to testing cost and testing time reduction. Fault prediction models use software metrics and defect data of earlier or similar versions of the project in order to improve software quality and exploit available resources. However, some issues such as cost, experience, and time, limit the availability of faulty data for modules or classes. In such cases, researchers focus on unsupervised techniques such as clustering and they use experts or thresholds for labeling modules as faulty or not faulty. In this paper, we propose a prediction model by utilizing self-organizing map (SOM) with threshold to build a better prediction model that could help testers in labeling process and does not need experts to label the modules any more. Data sets obtained from three Turkish white-goods controller software are used in our empirical investigation. The results based on the proposed technique is shown to aid the testers in making better estimation in most of the cases in terms of overall error rate, false positive rate (FPR), and false negative rate (FNR).
  • Keywords
    fault diagnosis; program testing; self-organising feature maps; software metrics; software quality; unsupervised learning; Turkish white-goods controller software; clustering techniques; false negative rate; false positive rate; fault prediction models; faulty data availability; labeling process; self-organizing map; software metrics; software quality; software testing process; unsupervised techniques; Clustering algorithms; Measurement; Neurons; Prediction algorithms; Software; Testing; Vectors; False negative rate (FNR); False positive rate (FPR); Self-organizing map (SOM); Software fault prediction; Threshold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control System, Computing and Engineering (ICCSCE), 2013 IEEE International Conference on
  • Conference_Location
    Mindeb
  • Print_ISBN
    978-1-4799-1506-4
  • Type

    conf

  • DOI
    10.1109/ICCSCE.2013.6720010
  • Filename
    6720010