Increasing testability in QCA circuits using a new test method

Author

Adineh-Vand, A. ; Latif-Shabgahi, G. ; Azghadi, Mostafa Rahimi

Author_Institution

Comput. Dept., Islamic Azad Univ., Arak

fYear

2008

fDate

20-22 Dec. 2008

Firstpage

40

Lastpage

44

Abstract

Recently testing of quantum-dot cellular automata circuits has attracted a lot of attention. This paper proposes a novel method for testing QCA circuits. The method is based on circuit partitioning capability and multi-layer feature of QCA circuits. It can be useful for testing large circuits with many inputs. The proposed test method has potential to increase observability and controllability of QCA circuits, and hence it can amplify testability. In addition, it can be an effective method regarding to built in self test (BIST) technique. Some simulations are performed using a QCA circuit layout and functionality checking tool, called QCADesigner.

Keywords

built-in self test; cellular automata; circuit testing; controllability; observability; quantum dots; BIST; QCA circuits; QCADesigner; built in self test; circuit partitioning capability; circuits controllability; circuits observability; functionality checking tool; multi-layer feature; quantum-dot cellular automata circuits; Automatic testing; CMOS technology; Circuit faults; Circuit testing; Electronic equipment testing; Electrons; Power engineering computing; Quantum cellular automata; Quantum computing; Quantum dots; BIST; Multi-Layer QCA; Partitioning; QCA; Testability;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Test Workshop, 2008. IDT 2008. 3rd International

Conference_Location

Monastir

Print_ISBN

978-1-4244-3479-4

Electronic_ISBN

978-1-4244-3478-7

Type

conf

DOI

10.1109/IDT.2008.4802462

Filename

4802462