DocumentCode
3002755
Title
An approach to capture system interaction failures of a complex system
Author
Augustine, Manu ; Yadav, Om P. ; Jain, Rakesh ; Rathore, Ajay P S
Author_Institution
Dept. of Mech. Eng., Malaviya Nat. Inst. of Technol. (MNIT), Jaipur, India
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
6
Abstract
This paper addresses two main issues pertaining to currently available failure analysis (FA) techniques that are applicable in early product design stages: (i) their inability in capturing many unanticipated system interactions that lead to many failure modes being left unaccounted for, after FA has been conducted; and (ii) their inability in identifying root causes of failure modes that have already been captured. To address these issues, this paper proposes a cognitive map based FA framework that facilitates the generation of a wide variety of failure modes including system interaction failures in early design stages by effectively capturing the propagation of causality. It also presents a convenient basis for performing root cause analysis of identified failures using a mathematically rigorous backtracking algorithm. The proposed framework lends the much required quantitative formalism to design stage FA in generating failure modes as well as in tracking down the root causes of failures identified. A typical electric water heater is taken as example to demonstrate the applicability of the framework.
Keywords
causality; electric heating; failure analysis; backtracking algorithm; causality propagation; cognitive map based FA framework; complex system; electric water heater; failure analysis techniques; root cause analysis; system interaction failures; unanticipated system interactions; Algorithm design and analysis; Anodes; Equations; Mathematical model; Resistance heating; Valves; Water heating; cognitive map; failure analysis; system interaction failures; system modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754455
Filename
5754455
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