• DocumentCode
    3002755
  • Title

    An approach to capture system interaction failures of a complex system

  • Author

    Augustine, Manu ; Yadav, Om P. ; Jain, Rakesh ; Rathore, Ajay P S

  • Author_Institution
    Dept. of Mech. Eng., Malaviya Nat. Inst. of Technol. (MNIT), Jaipur, India
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper addresses two main issues pertaining to currently available failure analysis (FA) techniques that are applicable in early product design stages: (i) their inability in capturing many unanticipated system interactions that lead to many failure modes being left unaccounted for, after FA has been conducted; and (ii) their inability in identifying root causes of failure modes that have already been captured. To address these issues, this paper proposes a cognitive map based FA framework that facilitates the generation of a wide variety of failure modes including system interaction failures in early design stages by effectively capturing the propagation of causality. It also presents a convenient basis for performing root cause analysis of identified failures using a mathematically rigorous backtracking algorithm. The proposed framework lends the much required quantitative formalism to design stage FA in generating failure modes as well as in tracking down the root causes of failures identified. A typical electric water heater is taken as example to demonstrate the applicability of the framework.
  • Keywords
    causality; electric heating; failure analysis; backtracking algorithm; causality propagation; cognitive map based FA framework; complex system; electric water heater; failure analysis techniques; root cause analysis; system interaction failures; unanticipated system interactions; Algorithm design and analysis; Anodes; Equations; Mathematical model; Resistance heating; Valves; Water heating; cognitive map; failure analysis; system interaction failures; system modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754455
  • Filename
    5754455