Title :
Near infrared inelastic light scattering spectroscopy of high efficiency solar cells device structures based on III-V compounds
Author :
Bairamov, B.H. ; Ipatova, I.P. ; Negoduyko, V.K. ; Voitenko, V.A. ; Toporov, V.V. ; Irmer, G. ; Monecke, J.
Author_Institution :
A.F. Ioffe Phys.-Tech. Inst., Russia
Abstract :
The authors report on the experimental and theoretical study of the near infrared inelastic electronic light scattering of the most promising high-efficiency tandem concentrator solar cells device structures based on nand p-type GaAs, InP, InGaAs, and InGaAsP, grown by LPE. They show that the scattering mechanisms associated with charge-, spin-, and momentum-density fluctuations of free electron gas are represented by different line shapes and occurred in corresponding concentration ranges. A new approach to the problem and observed results provide clear evidence that the sensitivity of the developed measurements in solar cell semiconductor structures provide a unique opportunity for their characterization and optimization
Keywords :
III-V semiconductors; infrared spectroscopy; light scattering; liquid phase epitaxial growth; semiconductor device models; semiconductor device testing; semiconductor growth; solar cells; solar energy concentrators; GaAs; III-V semiconductor compounds; InGaAs; InGaAsP; InP; LPE growth; characterization; charge fluctuations; free electron gas; line shapes; measurements; momentum-density fluctuations; near infrared inelastic electronic light scattering; optimization; scattering mechanisms; sensitivity; solar cells; spin fluctuations; tandem concentrator solar cells; Electrons; Fluctuations; Gallium arsenide; Indium gallium arsenide; Indium phosphide; Infrared spectra; Light scattering; Photovoltaic cells; Shape; Spectroscopy;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520658