DocumentCode
3003048
Title
A method of quantitative analysis for dynamic fault tree
Author
Zhang, Hong-Lin ; Zhang, Chun-Yuan ; Liu, Dong ; Li, Rui
Author_Institution
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
6
Abstract
In order to efficiently perform reliability quantitative analysis for dynamic system, whose behaviors containing temporal dependency make the analysis very complicated, a quantitative analysis method applied to dynamic fault tree is proposed. Above all, the conception of extended cut sequence is brought forward. Extended cut sequence includes temporal logic and has more expressive capability than previous similar conceptions. Secondly, generates the set of minimal extended cut sequence. Thirdly, the conflict detection, the reduction of temporal constraints and the topological sort of basic events are carried out to quantitatively analyze each cut item. Finally, the system reliability parameters are acquired through the combination. One example is particularly described to evaluate this method which is compared to another method. The result shows that this method has concise expressive form of cut sequence, efficient process, precise data and low time cost. This method also provides a novel foundation for further research on reliability quantitative analysis.
Keywords
fault trees; logic gates; temporal logic; conflict detection; dynamic fault tree; extended cut sequence conception; reliability quantitative analysis; temporal constraints reduction; temporal dependency; temporal logic; Color; Discrete Fourier transforms; Fault trees; Image edge detection; Logic gates; Random access memory; Reliability; dynamic fault tree; extended cut sequence; quantitative analysis; reliability analysis; temporal logic;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754471
Filename
5754471
Link To Document