• DocumentCode
    3003048
  • Title

    A method of quantitative analysis for dynamic fault tree

  • Author

    Zhang, Hong-Lin ; Zhang, Chun-Yuan ; Liu, Dong ; Li, Rui

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In order to efficiently perform reliability quantitative analysis for dynamic system, whose behaviors containing temporal dependency make the analysis very complicated, a quantitative analysis method applied to dynamic fault tree is proposed. Above all, the conception of extended cut sequence is brought forward. Extended cut sequence includes temporal logic and has more expressive capability than previous similar conceptions. Secondly, generates the set of minimal extended cut sequence. Thirdly, the conflict detection, the reduction of temporal constraints and the topological sort of basic events are carried out to quantitatively analyze each cut item. Finally, the system reliability parameters are acquired through the combination. One example is particularly described to evaluate this method which is compared to another method. The result shows that this method has concise expressive form of cut sequence, efficient process, precise data and low time cost. This method also provides a novel foundation for further research on reliability quantitative analysis.
  • Keywords
    fault trees; logic gates; temporal logic; conflict detection; dynamic fault tree; extended cut sequence conception; reliability quantitative analysis; temporal constraints reduction; temporal dependency; temporal logic; Color; Discrete Fourier transforms; Fault trees; Image edge detection; Logic gates; Random access memory; Reliability; dynamic fault tree; extended cut sequence; quantitative analysis; reliability analysis; temporal logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754471
  • Filename
    5754471