Title :
Session 30 - CMOS and Interconnect Reliability - Gate Dielectric Reliability - Breakdown, and Device Degradation Mechanism
Abstract :
Summary form only given. Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8684-1
DOI :
10.1109/IEDM.2004.1419268
