Title :
1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers [Front Cover]
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
automatic testing; circuit analysis computing; circuit layout CAD; logic CAD; logic testing; optimisation; Boolean function manipulation; CAD frameworks; analog layout; automatic test pattern generation; circuit simulation; combinatorial optimization; complexity; floorplanning algorithms; high-level synthesis; interacting sequential machines; logic; logic synthesis; module generation; parallel matrix techniques; partitioning; performance enhancements; reliability simulation; routing algorithms; sequential optimization; sequential verification; switch-level simulation; technology driven routing; timing analysis; verification; yield maximization;
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
DOI :
10.1109/ICCAD.1990.129987
