Title :
Typical super early degradation failures of mass-produced complex electronics
Author :
Verbitsky, David E.
Author_Institution :
6 Cactus Ct., Edison, NJ 08820, USA
Abstract :
Physics of quasi-instantaneous prevalent failures of commercial devices are studied using systematic analytical methodology. Primary modes and mechanisms are revealed and classified, based on the interactions of gross-marginal features, faults and stresses. Highly accelerated degradation models and joint FTA-FMECA technique substantiate and interpret failure dynamics. Fixes dramatic improved quality and reduced losses of all product lines.
Keywords :
electronic products; failure analysis; failure dynamics; gross-marginal features; highly accelerated degradation models; joint FTA-FMECA technique; mass-produced complex electronics; quasiinstantaneous prevalent failures; super early degradation failures; Acceleration; Assembly; Degradation; Mathematical model; Reliability; Stress; Transportation; analysis; classification; early fault failure; infant mortality; quality; reliability;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-8857-5
DOI :
10.1109/RAMS.2011.5754489
